Biography:
The author has written and co-written more than 30 scientific articles and has participated in the development of alternative methods for analysing materials. These include XPS with potential input, ion Auger spectroscopy, the potential contrast method and EBIC in electron microscopy, among others. His areas of scientific interest include XPS, FIB-SEM and surface chemistry.
Title : Applying an external bias in XPS as a means to obtain additional information about materials